Angstrom analysis with dynamic in-situ aberration corrected electron microscopy
نویسندگان
چکیده
منابع مشابه
New possibilities with aberration-corrected electron microscopy.
Unlike light microscopy, where resolution is diffraction limited, the achievable resolution of electron microscopes is limited by lens aberrations so severe that the practical resolution is orders of magnitude worse than the diffraction limit. About 10 years ago, the first practical electron lens spherical aberration correctors were developed, and in the past decade, their performance, versatil...
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The attainable specimen resolution is determined by the instrumental resolution limit d(i) and by radiation damage. Solid objects such as metals are primarily damaged by atom displacement resulting from knock-on collisions of the incident electrons with the atomic nuclei. The instrumental resolution improves appreciably by means of aberration correction. To achieve atomic resolution at voltages...
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Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures (approximately 2000 degrees C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd...
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The very rich history of electron microscopy started with the discovery of the duality wave–particle. In the 1920s, the beginning of the twentieth century, it was shown that electrons could also behave as a wave. The optical microscopy based on Abbe’s theory already achieved the resolution limit ~ / ~ , λ 2 2 500Å. The electrons are located at high voltages and hence will have much shorter wave...
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Aberration correction in the TEM is now relatively well established with more than 20 corrected instruments installed worldwide. This paper will review these instrumental advances and will also describe the underlying theory and computation required to optimise data acquisition and interpret aberration corrected images. Finally the combination of direct electron optical correction and indirect ...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2010
ISSN: 1742-6596
DOI: 10.1088/1742-6596/241/1/012055